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Introduction to Scanning ­Tunneling Microscopy
Monographs on the Physics and Chemistry of Materials

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Format
Hardback, 488 pages
Other Formats Available

Paperback : HK$657.00

Hardback : HK$1,284.00

Published
United Kingdom, 1 November 2007

The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this 'bible' in the field. The second edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed of scanning to observe life phenomena in real time is a key. Advanced in this direction is presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones of nanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts.


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Product Description

The scanning tunneling microscope and the atomic force microscope, both capable of imaging and manipulating individual atoms, were crowned with the Nobel Prize in Physics in 1986, and are the cornerstones of nanotechnology today. The first edition of this book has nurtured numerous beginners and experts since 1993. The second edition is a thoroughly updated version of this 'bible' in the field. The second edition includes a number of new developments in the field. Non-contact atomic-force microscopy has demonstrated true atomic resolution. It enables direct observation and mapping of individual chemical bonds. A new chapter about the underlying physics, atomic forces, is added. The chapter on atomic force microscopy is substantially expanded. Spin-polarized STM has enabled the observation of local magnetic phenomena down to atomic scale. A pedagogical presentation of the basic concepts is included. Inelastic scanning tunneling microscopy has shown the capability of studying vibrational modes of individual molecules. The underlying theory and new instrumentation are added. For biological research, to increase the speed of scanning to observe life phenomena in real time is a key. Advanced in this direction is presented as well. The capability of STM to manipulate individual atoms is one of the cornerstones of nanotechnology. The theoretical basis and in particular the relation between tunneling and interaction energy are thoroughly presented, together with experimental facts.

Product Details
EAN
9780199211500
ISBN
0199211507
Age Range
Other Information
255 line drawings and 35 halftones
Dimensions
23.9 x 16 x 2.8 centimeters (0.96 kg)

Table of Contents

1: Overview
Part I
PRINCIPLES
2: Tunneling Phenomena
3: Tunneling Matrix Elements
4: Atomic forces
5: Atomic Forces and Tunneling
6: Nanometer-Scale Imaging
7: Atomic-Scale Imaging
8: Nanomechanical Effects
Part II
INSTRUMENTATION
9: Piezoelectric Scanners
10: Vibration Isolation
11: Electronics and Control
12: Mechanical Design
13: Tip Treatment
14: Scanning Tunneling Spectroscopy
15: The Atomic Force Microscope
16: Illustrative Applications
APPENDICES
A: Green's Functions
B: Spherical Modified Bessel Functions
C: Surface symmetry
D: Elementary elasticity theory

About the Author

Dr. C. Julian Chen
Senior Research Scientist
Department of Applied Physics and Applied Mathematics
Columbia University, New York.

Reviews

`Review from previous edition An excellent book which will benefit students and scientists alike.'
Tien T. Tsong, Pennsylvania State University
`A remarkable achievement, a beautiful piece of work.'
Andrew Briggs, University of Oxford
`Provides a good introduction to the field for newcomers, and also contains valuable material and hints for experts.'
Heinrich Rohrer, IBM
`The great value of the Chen book is that it attempts pedagogical soundness, and so is useful for teaching.'
John Spence, Arizona State University

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