Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM).
The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining device performances. The coverage spectroscopy method presented in the book is strongly application oriented and has several implementations supporting advanced surface analysis through many scanning probe microscopy techniques. Therefore this book will be of great value to both materials scientists and physicists who conduct research in this area.
Theory and Modeling of Cylindrical Nanostructures for High-Resolution Coverage Spectroscopy presents a new method for the evaluation of the coverage distribution of randomly deposited nanoparticles, such as single-walled carbon nanotubes and Ag nanowires over the substrate (oxides, SiO2, Si3N4, glass etc.), through height measurements performed by scanning probe microscopy techniques, like Atomic Force Microscopy (AFM).
The deposition of nanoparticles and how they aggregate in multiple layers over the substrate is one of the most important aspects of solution processed materials determining device performances. The coverage spectroscopy method presented in the book is strongly application oriented and has several implementations supporting advanced surface analysis through many scanning probe microscopy techniques. Therefore this book will be of great value to both materials scientists and physicists who conduct research in this area.
Presents a new method for evaluating the coverage distribution of randomly deposited nanoparticles through height measurements performed by scanning probe microscopy techniques
Chapter I – The coverage theory and the Delta model approximation1.
The physical model2. Simulations3. The coverage error theory4.
Experimental verification – Part I5. A model for multiple CNT
intersections6. Generalized coverage theory7. Experimental
verification – Part II8. Matlab© scripts9. AFM Measured CNT height
density database
Chapter II – Statistical diameter modelling and height density
functions1. The general equation of the height density2.
Deterministic diameter3. Uniform diameter density4. Rayleigh
diameter density5. Gaussian-Harmonic (GH) diameter density6.
Measured diameter density7. Summary of height statistics8. Gaussian
convolution with height densities9. Comparison among statistical
models
Chapter III – The generalized coverage theory and experimental
verification1. Redefining the coverage physical model2. Coverage
solution: “DESIGN mode 3. Coverage solution: MEASURE mode4. CNTs
with random direction5. Experimental verifications
Chapter IV – The Gaussian-Harmonic model of the substrate height
density1. A new model for the substrate height2. The
Gaussian-Harmonic height density3. MMSE fitting4. Application to
randomized height densities5. Measurements of Silver nanowires
Stefano Bottacchi currently works as a photonic networks consultant for Fraunhofer Heinrich Hertz Institute. He has previously worked for several leading research organizations, including Infineon Technologies AG, TriQuint Semiconductor and u2t Photonics AG. Dr. Bottacchi has published three books and many peer-reviewed articles, and he is a senior member of IEEE. Francesca Bottacchi is currently working as a yield engineer for FlexEnable Ltd. She was a Marie Curie Early Stage Researcher at the Blackett Laboratory in the Department of Physics at the Imperial College London, UK where she obtained her PhD in experimental solid state physics as part of a EU FP7 project. Dr. Bottacchi has previously published one book and authored many peer-reviewed articles.
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