Computer Forensics Jumpstart

By Micah Solomon, Diane Barrett, Neil Broom

Computer Forensics Jumpstart

By Micah Solomon, Diane Barrett, Neil Broom

HK$169 Elsewhere ~~HK$241.74~~ Save HK$72.74 (30%)

1

Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)

By Jha, Niraj K., Kundu, Sandip

Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)

By Jha, Niraj K., Kundu, Sandip

HK$1,291

Neural Models and Algorithms for Digital Testing (Springer International Series in Engineering and Computer Science The)

By Srimat T. Chakradhar, Vishwani D. Agrawal, M. Bushnell

Neural Models and Algorithms for Digital Testing (Springer International Series in Engineering and Computer Science The)

By Srimat T. Chakradhar, Vishwani D. Agrawal, M. Bushnell

HK$1,000

Sequential Logic Testing and Verification (The Springer International Series in Engineering and Computer Science)

By Devadas, Srinivas, Ghosh, Abhijit, A. Richard Newton

Sequential Logic Testing and Verification (The Springer International Series in Engineering and Computer Science)

By Devadas, Srinivas, Ghosh, Abhijit, A. Richard Newton

HK$1,400

Assessing Fault Model and Test Quality (The Springer International Series in Engineering and Computer Science)

By Butler, Kenneth M., Mercer, M. Ray

Assessing Fault Model and Test Quality (The Springer International Series in Engineering and Computer Science)

By Butler, Kenneth M., Mercer, M. Ray

HK$973

Efficient Branch and Bound Search with Application to Computer-Aided Design (Frontiers in Electronic Testing)

By Bushnell, Michael L., Xinghao Chen

Efficient Branch and Bound Search with Application to Computer-Aided Design (Frontiers in Electronic Testing)

By Bushnell, Michael L., Xinghao Chen

HK$978

1

Computer Integrated Electronics Manufacturing and Testing (Manufacturing Engineering and Materials Processing)

By Arabian, Jack H.

Computer Integrated Electronics Manufacturing and Testing (Manufacturing Engineering and Materials Processing)

By Arabian, Jack H.

HK$2,381 Elsewhere ~~HK$3,728.38~~ Save HK$1,347.38 (36%)

An Artificial Intelligence Approach to Test Generation (The Springer International Series in Engineering and Computer Science)

By Singh, Narinder

An Artificial Intelligence Approach to Test Generation (The Springer International Series in Engineering and Computer Science)

By Singh, Narinder

HK$1,000

Efficient Branch and Bound Search with Application to Computer-Aided Design (Frontiers in Electronic Testing)

By Bushnell, Michael L., Xinghao Chen

Efficient Branch and Bound Search with Application to Computer-Aided Design (Frontiers in Electronic Testing)

By Bushnell, Michael L., Xinghao Chen

HK$883

1

Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)

By Jha, Niraj K., Kundu, Sandip

Testing and Reliable Design of CMOS Circuits (The Springer International Series in Engineering and Computer Science)

By Jha, Niraj K., Kundu, Sandip

HK$1,260 Elsewhere ~~HK$1,309.87~~ Save HK$49.87 (4%)

Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science)

By Bhattacharya, Debashis, Hayes, John P.

Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science)

By Bhattacharya, Debashis, Hayes, John P.

HK$886

An Artificial Intelligence Approach to Test Generation (The Springer International Series in Engineering and Computer Science)

By Singh, Narinder

An Artificial Intelligence Approach to Test Generation (The Springer International Series in Engineering and Computer Science)

By Singh, Narinder

HK$893

Assessing Fault Model and Test Quality (The Springer International Series in Engineering and Computer Science)

By Butler, Kenneth M., Mercer, M. Ray

Assessing Fault Model and Test Quality (The Springer International Series in Engineering and Computer Science)

By Butler, Kenneth M., Mercer, M. Ray

HK$882

Sequential Logic Testing and Verification (The Springer International Series in Engineering and Computer Science)

By Devadas, Srinivas, Ghosh, Abhijit, A. Richard Newton

Sequential Logic Testing and Verification (The Springer International Series in Engineering and Computer Science)

By Devadas, Srinivas, Ghosh, Abhijit, A. Richard Newton

HK$1,260 Elsewhere ~~HK$1,309.87~~ Save HK$49.87 (4%)

Neural Models and Algorithms for Digital Testing (Springer International Series in Engineering and Computer Science The)

By S. T. Chadradhar, Vishwani D. Agrawal, Michael L. Bushnell

Neural Models and Algorithms for Digital Testing (Springer International Series in Engineering and Computer Science The)

By S. T. Chadradhar, Vishwani D. Agrawal, Michael L. Bushnell

HK$892

Protocol Specification and Testing

By Tarnay, Katalin

Protocol Specification and Testing

By Tarnay, Katalin

HK$900

Testing of Communicating Systems

By Gyula Csopaki, Margit Dibuz, Katalin Tarnay

Testing of Communicating Systems

By Gyula Csopaki, Margit Dibuz, Katalin Tarnay

HK$475

Parsing the Turing Test (Philosophical and Methodological Issues in the Quest for the Thinking Computer)

By Robert Epstein, Gary E. Roberts, Grace Beber

Parsing the Turing Test (Philosophical and Methodological Issues in the Quest for the Thinking Computer)

By Robert Epstein, Gary E. Roberts, Grace Beber

HK$1,790

Computer Systems Engineering Management

By Robert S. Alford

Computer Systems Engineering Management

By Robert S. Alford

HK$1,900 Elsewhere ~~HK$2,216.88~~ Save HK$316.88 (14%)

Computer-Aided Dispatch (Traffic Management Center Field Operational Test - Scholar's Choice Edition)

By D Federal Highway Administration

Computer-Aided Dispatch (Traffic Management Center Field Operational Test - Scholar's Choice Edition)

By D Federal Highway Administration

HK$150

Computer Specialist (Career Examination)

By Passbooks

Computer Specialist (Career Examination)

By Passbooks

HK$473

Theory of Nonparametric Tests

By Dickhaus, Thorsten

Theory of Nonparametric Tests

By Dickhaus, Thorsten

HK$455

Computer Vision for X-Ray Testing (Imaging, Systems, Image Databases, and Algorithms)

By Pieringer, Christian, Mery, Domingo

Computer Vision for X-Ray Testing (Imaging, Systems, Image Databases, and Algorithms)

By Pieringer, Christian, Mery, Domingo

HK$700

Computer Vision for X-Ray Testing (Imaging, Systems, Image Databases, and Algorithms)

By Pieringer, Christian, Mery, Domingo

Computer Vision for X-Ray Testing (Imaging, Systems, Image Databases, and Algorithms)

By Pieringer, Christian, Mery, Domingo

HK$534

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