Name: Practical Materials Characterization
Brand: Springer
SKU: 40938845
Price: 1000 HKD
Availability: InStock

Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)

By D. Briggs, D. R. Clarke, S. Suresh, I. M. Ward

Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)

By D. Briggs, D. R. Clarke, S. Suresh, I. M. Ward

HK$428 Elsewhere ~~HK$516.18~~ Save HK$88.18 (17%)

Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)

By D. Briggs, D.R. Clarke, S. Suresh, I.M. Ward

Surface Analysis of Polymers by XPS and Static SIMS (Cambridge Solid State Science Series)

By D. Briggs, D.R. Clarke, S. Suresh, I.M. Ward

HK$960 Elsewhere ~~HK$1,290.72~~ Save HK$330.72 (26%)

Secondary Ion Mass Spectrometry SIMS II (Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 (Springer Series in Chemical Physics))

By A. Benninghoven, C.A. Jr. Evans, R.A. Powell, R. Shimizu

Secondary Ion Mass Spectrometry SIMS II (Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 (Springer Series in Chemical Physics))

By A. Benninghoven, C.A. Jr. Evans, R.A. Powell, R. Shimizu

HK$1,000

Secondary Ion Mass Spectrometry SIMS IV (Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983 (Springer Series in Chemical Physics))

By A. Benninghoven, J. Okano, R. Shimizu, H. W. Werner

Secondary Ion Mass Spectrometry SIMS IV (Proceedings of the Fourth International Conference, Osaka, Japan, November 13–19, 1983 (Springer Series in Chemical Physics))

By A. Benninghoven, J. Okano, R. Shimizu, H. W. Werner

HK$1,060

Secondary Ion Mass Spectrometry SIMS V (Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985 (Springer Series in Chemical Physics))

By Alfred Benninghoven, Richard J. Colton, David S. Simons, Helmut W. Werner

Secondary Ion Mass Spectrometry SIMS V (Proceedings of the Fifth International Conference, Washington, DC, September 30 – October 4, 1985 (Springer Series in Chemical Physics))

By Alfred Benninghoven, Richard J. Colton, David S. Simons, Helmut W. Werner

HK$1,078

Secondary Ion Mass Spectrometry SIMS III (Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981 (Springer Series in Chemical Physics))

By A. Benninghoven, J. Giber, J. Laszlo, M. Riedel

Secondary Ion Mass Spectrometry SIMS III (Proceedings of the Third International Conference, Technical University, Budapest, Hungary, August 30–September 5, 1981 (Springer Series in Chemical Physics))

By A. Benninghoven, J. Giber, J. Laszlo, M. Riedel

HK$1,040

The Encyclopedia of Mass Spectrometry (Ionization Methods: v. 6)

By R. M. Caprioli, Michael L. Gross

The Encyclopedia of Mass Spectrometry (Ionization Methods: v. 6)

By R. M. Caprioli, Michael L. Gross

HK$3,360 Elsewhere ~~HK$3,562.38~~ Save HK$202.38 (6%)

Solid State Microbatteries (NATO Science Series B:)

By James R. Akridge, Minko Balkanski

Solid State Microbatteries (NATO Science Series B:)

By James R. Akridge, Minko Balkanski

HK$1,637

Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization)

By Alvin W. Czanderna, David M. Hercules

Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization)

By Alvin W. Czanderna, David M. Hercules

HK$891

Introduction to Mass Spectrometry (Instrumentation, Applications, and Strategies for Data Interpretation)

By Watson, J. Throck, Sparkman, O. David

Introduction to Mass Spectrometry (Instrumentation, Applications, and Strategies for Data Interpretation)

By Watson, J. Throck, Sparkman, O. David

HK$758 Elsewhere ~~HK$959.78~~ Save HK$201.78 (21%)

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Organic Mass Spectrometry in Art and Archaeology

By Maria Perla Colombini, Francesca Modugno

Organic Mass Spectrometry in Art and Archaeology

By Maria Perla Colombini, Francesca Modugno

HK$1,900

Fundamentals of Contemporary Mass Spectrometry (Wiley-Interscience Series on Mass Spectrometry)

By Chhabil Dass, Dominic M. Desiderio, Nico M. Nibbering

Fundamentals of Contemporary Mass Spectrometry (Wiley-Interscience Series on Mass Spectrometry)

By Chhabil Dass, Dominic M. Desiderio, Nico M. Nibbering

HK$1,280 Elsewhere ~~HK$1,445.09~~ Save HK$165.09 (11%)

Mass Spectrometry of Polymers

By Giorgio Montaudo, Robert P. Lattimer

Mass Spectrometry of Polymers

By Giorgio Montaudo, Robert P. Lattimer

HK$700

Introduction to Focused Ion Beams (Instrumentation, Theory, Techniques and Practice)

By Lucille A. Giannuzzi, Fred A. Stevie

Introduction to Focused Ion Beams (Instrumentation, Theory, Techniques and Practice)

By Lucille A. Giannuzzi, Fred A. Stevie

HK$1,760 Elsewhere ~~HK$1,992.87~~ Save HK$232.87 (12%)

X-ray Photoelectron Spectroscopy (An introduction to Principles and Practices)

By Heide, Paul van der

X-ray Photoelectron Spectroscopy (An introduction to Principles and Practices)

By Heide, Paul van der

HK$800 Elsewhere ~~HK$887.50~~ Save HK$87.50 (10%)

Mass Spectrometry - An Applied Approach, 2nd Edition

By Smoluch, Marek, Grasso, Giuseppe

Mass Spectrometry - An Applied Approach, 2nd Edition

By Smoluch, Marek, Grasso, Giuseppe

HK$955 Elsewhere ~~HK$1,032.06~~ Save HK$77.06 (7%)

Mass Spectrometry Imaging (Principles and Protocols (Methods in Molecular Biology))

By Stanislav S. Rubakhin, Jonathan V. Sweedler

Mass Spectrometry Imaging (Principles and Protocols (Methods in Molecular Biology))

By Stanislav S. Rubakhin, Jonathan V. Sweedler

HK$1,383

Introduction to Focused Ion Beams (Instrumentation, Theory, Techniques and Practice)

By Lucille A. Giannuzzi, North Carolina State University

Introduction to Focused Ion Beams (Instrumentation, Theory, Techniques and Practice)

By Lucille A. Giannuzzi, North Carolina State University

HK$1,200 Elsewhere ~~HK$1,404.30~~ Save HK$204.30 (15%)

Mass Spectrometry in Environmental Sciences

By O. Hutzinger, F.W. Karasek, S. Safe

Mass Spectrometry in Environmental Sciences

By O. Hutzinger, F.W. Karasek, S. Safe

HK$1,076

Ion Implantation in Semiconductors 1976

By Fred Chernow

Ion Implantation in Semiconductors 1976

By Fred Chernow

HK$680

Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization)

By Alvin W. Czanderna, David M. Hercules

Ion Spectroscopies for Surface Analysis (Methods of Surface Characterization)

By Alvin W. Czanderna, David M. Hercules

HK$595

Helium Ion Microscopy (Principles and Applications (SpringerBriefs in Materials))

By Joy, David C.

Helium Ion Microscopy (Principles and Applications (SpringerBriefs in Materials))

By Joy, David C.

HK$687

Practical Materials Characterization

By Mauro Sardela

Practical Materials Characterization

By Mauro Sardela

HK$1,000

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